Tequra Analytics has powerful features which get more information from your measurements
Tequra Analytics enables you to get a quantitative insight into the variability of a manufacturing process. Using the process capability features you retrieve process capability index and process performance index figures at the touch of a button.
More on Process Capability
|Ppk||Process Performance Index|
|Cp||Process capability. Unlike Cpk it ignores whether measurements are not well centered between limits.|
|Cpl||Process capability for measurements with only a lower limit.|
|Cpu||Process capability for measurements with only an upper limit.|
|Pp||Process performance index. Unlike Cpk it ignores whether measurements are not well centered between limits.|
|Ppl||Process performance index for measurements with only an upper limit.|
|Ppu||Process performance index for measurements with only a lower limit.|
Easily perform statistical analysis on your test results using Tequra analytics. Pull out figures such as mean, median standard deviation and max-min. Use filtering to select a region of interest to perform the analysis over.
Full Statistics Listing
|Standard Deviation (Short Term)|
|Standard Deviation (Long Term)|
See a graphical representation of measurement distribution using the Tequra Analytics histogram feature. Use filtering tools to select a section of results to perform this analysis over.
Look for trends in individual measurements over time, with this graphical view. Use filtering to restrict the data to a particular time range. See how measurements lie compared to upper and lower test limits.